A $7.6 million order has been received for WaferPak full wafer Contactors to meet increased production capacity needs.
Aehr Test Systems has announced it has received a $7.6 million order from its lead silicon carbide test and burn-in customer for WaferPak full wafer Contactors to meet their increased production capacity needs. These WaferPaks are scheduled to be delivered over the next five months to accompany the FOX-XP systems previously ordered by this customer announced in September.
Gayn Erickson, President and CEO of Aehr Test Systems, commented, “These WaferPak Contactors accompany the previous $19 million order for FOX-XP production test systems from this customer to meet their capacity needs for testing silicon carbide devices used for power conversion in on-board and off-board electric vehicle chargers, as well as the traction inverters used in electric vehicle motor controllers. This customer, who is a leading Fortune 500 supplier of semiconductor devices with a significant customer base in the automotive semiconductor market, also expects demand for silicon carbide in other major markets, including home electric storage and solar power conversion.
“This order is for about two thirds of the WaferPaks needed to match the capacity of the FOX-XP systems this customer previously ordered, and we expect them to order additional WaferPaks to accompany the systems that are scheduled to be shipped over the next seven months. In addition to their forecast for additional WaferPaks this fiscal year, this customer forecasts significant additional system and WaferPak purchases, reflecting the growing demand for silicon carbide devices for electric vehicle and other applications that multiple industry forecasters and analysts expect to grow at a compound annual growth rate (CAGR) of more than 30% over the next decade.
“Our proprietary WaferPaks feature patented technology that enable our FOX-XP systems to make electrical and thermal contact to all the devices on the wafer at the same time in a portable contactor cassette without the need for an expensive wafer prober per wafer.
source:power electronics news
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